Testing Solution for AI Accelerator Card|Testron Technology

Testing Solution for AI Accelerator Card

Product Parameters

BSI TAP control board Conduct BSI testing on Bscan IC

BSI TAP Extend board Conduct functional test among RAM/ROM and Bscan IC

IO & BUS test cards Conduct protocol testing on I/O control chips

HW interface test cards Conduct connectivity testing through loopback circuit

Small card Test platform

Product Advantages

● Suitable for rasier card, HDD, BP and other multi interface small cards Strong versatility and expandability

●Customizable IF card to support various storage interfaces and PCIE interfaces.

●Supports connectivity and functional testing, integrates boundary-scan testing technology to achieve full coverage of storage, Significantly reduces the material costs.